Tag Archives: F47 testing

SEMI’s F47 Voltage Sag Immunity Standard History From 1996-2006

SEMI’s F47 Voltage Sag Immunity Standard History From 1996-2006

What we now know as SEMI F47-0706 testing began as a series of research experiments conducted by The Electric Power Research Institute (EPRI) in the late 1990s under Section 24: Power Quality in the Semiconductor Industry. Industry participants and contributors to this study included just under thirty fortune 500 companies including AMD, Applied Materials, IBM, [...]
Ask Lewis Bass: A Question About F47 Testing Semiconductor Equipment

Ask Lewis Bass: A Question About F47 Testing Semiconductor Equipment

Welcome to another blog in our ongoing series, Ask Lewis Bass! This series features actual submitted questions from companies in the industries we provide engineering safety consulting services to. Topics covered include those associated with our work in 3rd party field labeling, SEMI S2/S8/EMC/F47 testing and design, CE Marking evaluations, and general engineering safety consulting [...]
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